Used HITACHI S-3400N #9167635 for sale

HITACHI S-3400N is a compact scanning electron microscope (SEM) specifically designed for efficient, high-performance research and industrial analysis. The equipment's small size allows it to easily fit into existing laboratory spaces while minimising maintenance requirements. This latest-generation SEM offers a suite of sophisticated features, including a digital image processing system, enabling accurate high-resolution imaging and analysis. HITACHI S-3400 N features a unique, high-resolution magnification unit. This is provided by a SEM column that employs a cylindrical electrostatic lens combined with a magnetic objective lens. This combination offers greatly improved resolution and contrast, enabling a much clearer view of the minute details of the microscopic world. S 3400 N is designed for maximum efficiency and speed. It uses a low-vacuum plasma emission source that generates greater stability, allowing for faster scan rates without sacrificing quality. In addition, the machine's high-sensitivity detectors are optimised for all imaging applications including secondary electron imaging, in situ tiltscanning, x-ray element analysis, and focused ion beam imaging. HITACHI S 3400 N can produce high-quality images of non-conductive materials, organic assemblies, particular mixtures, and more. It also allows users to accurately measure distances and other dimensions in an image and quickly report coordinates, angles, and more. Overall, S-3400N is an excellent scanning electron microscope that is both compact and powerful. Its high-resolution magnification and high-sensitivity detectors make it ideally suited for a wide range of research and industrial tasks. Its easy-to-use interface, excellent image quality and highly efficient scan rates make this tool a great choice for any laboratory.