Used HITACHI S-3400N #9314475 for sale

HITACHI S-3400N is a scanning electron microscope (SEM), used to maximize image clarity, reproducibility, and resolution. It is designed to facilitate an industrial setting where large-scale images and data are needed. HITACHI S-3400 N is equipped with a high-sensitive digital imaging device called an EverhighTM sensor, which allows for higher resolution and better contrast imaging. The device also has an optional large objective lens for a wide field of view and to capture more details. The EVERHIGHTM sensor is also capable of large area scanning with a resolution of up to 1000 x 1000 pixels, at over 15 frames per second. S 3400 N is controlled by HITACHI Multi-Stage® Control Software. This software allows users to access a variety of functions and features, such as the ability to adjust the magnification, the focus, and the energy level of the electrons emitted from the electron gun. The Multi-Stage Control Software also enables users to select the correct spot size for their images, as well as to store images for future use. In addition to its imaging capabilities, the HITACHI S 3400 N is also capable of performing sample analysis. Through its electron beam, the microscope can be used to conduct Energy Dispersive Spectrometry (EDS) and X-ray Fluorescence (XRF) to analyze materials. When it comes to safety, S-3400 N features a two-stage transmission mechanism, which automatically stops the emission of electrons when the leakage reaches a predetermined level. The device is also equipped with an automated system which ensures that the sample chamber is always at a non-destructive pressure. In conclusion, S-3400N is a sophisticated and powerful scanning electron microscope, which is ideal for those looking to capture high resolution and detailed images of their samples. With its advanced imaging and sample analysis capabilities, powerful software, and safety features you can rest assured that your HITACHI S-3400N will provide you with the reliable and accurate images you need.