Used HITACHI S-3400N #9316841 for sale

HITACHI S-3400N is a scanning electron microscope (SEM) that offers unparalleled performance, giving users the ability to analyze a wide range of samples with greater ease and accuracy. HITACHI S-3400 N produces high-resolution images with resolutions of up to 5nm and its variable pressure technology allows for a higher signal to noise ratio than traditional SEMs. Its large stage also allows for samples of up to 200mm in diameter, making it suitable for a wide range of applications. S 3400 N features an advanced electron gun and controller, which creates an ideal environment for high-quality imagery by controlling the electron beam accurately and precisely. In addition, the system is capable of detecting four different types of signals - secondary and backscattered electrons, as well as x-ray intensities and fluorescence. These allow for the detection of different sample features with greater sensitivity. HITACHI S 3400 N also includes an advanced software package called "SmartNavigator," which allows users to quickly and easily define image effects such as contrast, brightness, and contrast range. This feature simplifies the imaging process and allows more flexibility in manipulating images. Additionally, the software package includes an "intuitive pattern correction" function, which helps minimize defocusing, contrast errors, and field distortion. S-3400N also offers an extremely wide range of magnification capabilities, ranging from 50 to 700,000 times. Additionally, the system's generated images can be viewed with various digital image processing tools, depending on the application. These tools include 3D and 4D analysis, as well as defect contrast imaging. S-3400 N also allows users to transfer images from the SEM to an outside computer through a USB interface.These features and capabilities ensure that HITACHI S-3400N offers a comprehensive and powerful system for a wide range of microscopic imaging applications.