Used HITACHI S-3400N #9363668 for sale

HITACHI S-3400N Scanning Electron Microscope (SEM) is the latest generation of advanced research-grade instrumentation from HITACHI High Technologies. This product is designed for the most demanding scanning electron microscopy (SEM) applications such as imaging and analysis of millimeter-scale samples and ultra-high resolution imaging of nanometer-scale samples. It has a field emissiongun (FEG) source and features high geometrical stability, extremely low charge-up and low noise operation, excellent current stability and reduced sample drift. HITACHI S-3400 N includes a high magnification, wide field of view, adjustable height and tilt sample stage, along with a direct digital imaging system. TheStage can be fitted with optional cryostage and vacuum systemsfor use with both metallic and non-metallic specimens, allowing quantitative evaluation of electro-mechanical and thermoelectric properties at low temperatures. The sample manipulation system also includes a wide selection of sample holders, such as mechanical and electrostatic sample alignment and sample transfer. S 3400 N is equipped with digital imageanalyzers software that is easy to use and offers multiple imageinversion features. This instrument is also uniquely designed to allow users to view the primary SEM image, secondary images fromt the same detector or from different detectors, at the sametime. A full range of imaging parameters are available, including detectors for elemental elemental mapping. HITACHI S 3400 N can be used for a variety of applications,including imaging of insulation materials, visualizing the nanostructure of materials, electron diffraction and dynamicelectron microscopy. In addition, its high resolution imaging capabilities are essential for the inspection of microscaleobjects. Laboratory-tested and SICM certified, the S-3400Nprovides excellent image speed and quality and is a reliableworkhorse for SEM-related research applications. S-3400 N offers a wide range of features that help maximize your productivity and enhance SEM-related studies. With it's fully-automated, high-precision, advanced electronics, and the latest imaging technology, S-3400N is the ideal tool for a wide variety of research. HITACHI S-3400N can be upgraded with a range of additional optional accessories to fit the needs of your project and to improve your experience with scanning electron microscopy.