Used HITACHI S-3400N #9384953 for sale

HITACHI S-3400N is a scanning electron microscope (SEM) that offers high-resolution imaging and analytical capabilities for a wide range of materials and samples. It is built on the exceptional Advanced Parallel Electron Beam (APE) column, boasting an acceleration voltage up to 10 kV, beam current up to 200 pA, and beam energy spread from 5-200 keV, allowing for high-precision measurement of the shape, structure, and elemental composition of materials. HITACHI S-3400 N utilizes an advanced multi-polar Focus Alignment Equipment (FAS), which calibrates and maintains optimal performance with minimal effort. This system is equipped with a high-precision electron beam auto-focusing mechanism and an air-cooling unit, allowing it to remain functional even during extended observation periods. Additionally, this versatile instrument has 6-axis sample stage control, with a sample size ranging between 0.2mm and 100 mm and a sample weight up to 4kg. The main advantage of S 3400 N is its high resolution imaging capability. It is manufactured with a two-stage condenser lens with high numerical aperture, enabling the user to observe intricate structures and details in the sample down to 0.2 nanometers. In addition, the machine is equipped with an integrated SE (secondary electron) detector and a high-sensitivity SE detector, which enable the user to accurately obtain images from the sample with optimal speed. S-3400N also offers a wide range of analytical capabilities for studying samples. It can acquire EDX (energy-dispersive X-ray spectroscopy) spectra with a resolution up to 0.1%, as well as WDX (wavelength-dispersive X-ray spectroscopy) maps with a resolution up to 0.01%. It can also be used for EBSD (electron backscatter diffraction) observations, with four different analysis modes, as well as for surface analysis, with a range of surface states ranging from clean currents exceeding 1A/cm2 to flow-sensitive samples with surface currents up to 0.002A/cm2. To provide optimal performance for a variety of applications, HITACHI S 3400 N offers a range of advanced functions. These include a dual-view mode which allows the user to simultaneously observe the surface and the subsurface of the sample, as well as a 3D mode which allows 3D surface images of the sample to be captured. In addition, the instrument's advanced imaging control tool enables the user to easily manipulate the electron beam while observing the sample, as well as to store images, settings, and other data related to the observation. In a nutshell, S-3400 N is an advanced scanning electron microscope with several analytical and imaging capabilities that enable the user to observe and analyze samples with precision. Its advanced FAS asset, high-sensitivity detectors, powerful beam energy spread, and 6-axis sample stage control provide users with an optimal performance for a wide range of applications.