Used HITACHI S-3500N #293590955 for sale

ID: 293590955
Vintage: 1998
Scanning Electron Microscope (SEM) 1998 vintage.
HITACHI S-3500N is a scanning electron microscope (SEM) that provides excellent optimized resolution, superior ergonomics, and cost-effective operation in a digital imaging equipment. This microscope is built on a cooled 45° upright design, which provides a wide-field view, excellent detector sensitivity, and minimized electron beam exposure. It is equipped with a Beryllium beam condenser lens and a digital high-resolution imaging detector, which provide high-resolution and high-speed imaging. This superior imaging performance makes this microscope ideal for a wide variety of imaging and analysis applications, from nano-level analysis to research in materials science. The microscope is equipped with a high-sensitivity Everhard-Thornley (E-T) detector, and a high-resolution E-T secondary electron imaging detector for improved imaging as well as for sample analysis. The microscope also offers a wide range of automated analysis and imaging capabilities, including SEM imaging with automatic stitching, diffraction pattern analysis, full pattern search and optimization, automatic contrast, brightness and color enhancement, and image acquisition. This capability makes S-3500N especially useful for analyzing complex samples in a wide range of industries, from the medical and automotive industry to research laboratories. HITACHI S-3500N has a digital image processing system that provides image editing capabilities and overlaying of images. It also has an automated feature detection unit and an automated statistical analysis machine. This allows the microscope to analyze sample morphology, composition, and other related characteristics. With its advanced imaging capabilities, S-3500N is capable of providing high contrast, high-resolution images, as well as accurate measurement data. HITACHI S-3500N is designed to provide a user-friendly experience. Its intuitive graphical user interface is designed with an easy-to-use menu tool, making scans and image analysis fast and convenient. It is also equipped with a range of user-customizable features, such as image control, specimen preparation, and analysis parameters. S-3500N is an ideal choice for advanced imaging in scanning electron microscopy for a wide variety of research and development applications. With its superior imaging quality and automated analysis capabilities, HITACHI S-3500N is the perfect tool for research and analysis.
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