Used HITACHI S-3500N #9046383 for sale
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ID: 9046383
SEM
Resolution: 3.0nm at 25kV, secondary electron image
20nm at 3kV, secondary electron image
4.5nm at 25kV, backscattered electron image
Magnification: x15 - x300,000 (65 steps)
Accelerating voltage: 0.3 - 30kV
Variable pressure range: 1 - 270Pa
High and low vacuum operation
Backscatter electron detector
Energy Dispersive X-ray (EDS)
Orientation Imaging Microscopy (OIM)
Tungsten filaments
Optics:
Filament – pre-centered tungsten hairpin
Gun bias – self bias and continuously variable bias
Accelerating voltage: 10-30 kV
Emission current: 10-12 to 10-7
Gun alignment: 2-stage electromagnetic alignment
Condensers lens: 2-stage electromagnetic condenser
Objective lens: super conical lens
Objective lens aperture: 4 opening moveable aperture
Stigmator coil: 8-pole electromagnetic X/Y correction for astigmatism
Image shift: +/- 20 microns or more (for working distance 15 mm)
Specimen stage: Large-size eucentric stage
Movement range: 80mm x 40 mm
Tilt angle: 0° to +60°
Rotation angle: 360°
Image Display: Secondary electron
Scanning modes: TV scan, slow scan (4 steps), selected area scan, waveform, photo scan (4 steps), split screen and dual screen
Data display: accelerating voltage, magnification, micron scale, micron value, film number, working distance, value, time/date, photo magnification, detector
Data entry; input through full key board (alphabetic characters numerics and symbols)
Graphic input: straight lines, circles arrows etc.
Image memory:
Display (640 x480)
High resolution (1280 x 960)
Ultra-high resolution (2560 x 1920)
Computer system:
Hitachi soft-ware on Compaq PC with Windows 95, Pentium 160 MB processor
Hitachi software
Quartz PCI – imaging program
Auxiliary computer for EDS system – Dell, Intel Pentium
Two direct drive vacuum rotary vacuum pumps – Hitachi brand
Type VR16LPP 50 Hz, 60 Hz
Displacement 140, 160l/min
Ultimate pressure – 10-2 Pa
6W Infared Chamberscope
Components:
EDS system: PGT OPH045-1038
Backscattered detector
BSD system: Robinson
Computer system uses zip drives for downloading data, not USB
Original manuals and two Wehnelt cylinders.
HITACHI S-3500N Scanning Electron Microscope (SEM) is a powerful instrument that offers high accuracy and resolution for the analysis of a wide variety of materials. It is capable of producing detailed images of both organic and inorganic samples at magnifications of up to 100,000 times. The microscope is designed with an automated navigation system and a low-energy environmental chamber, allowing for high-resolution simplification and analysis of even complex samples. Using electron optics and a built-in energy-dispersive X-ray detector, S-3500N provides unmatched precision and speed of scanning in both bright and dark fields. Its Scanning Transmission Electron Microscopy (STEM) capabilities allow for convenient detection of light elements and structural features. Additionally, the microscope can acquire high-contrast, low-noise images, even of the most intricate nanostructures. HITACHI S-3500N model is also capable of performing imaging and analytical tasks in negative-staining, high-vacuum, dehydration, and special gaseous atmospheres. It is built with a special gas-inlet feature which allows for the controlled introduction of various types of gas within the sample. This feature, in combination with the detector design, enables the generation of analytical information about trace elements or local dopants in epitaxial layers, insulators, and semiconductors. S-3500N is a user-friendly instrument, featuring intuitive graphical user interfaces. Its embedded application suite includes components for real-time process monitoring, image measurements, single particle analysis, spectral imaging, egun selector, and more. Also, users can connect to a range of external devices via the scope's USB interface, allowing for the simultaneous acquisition of imagery and data from multiple sources. Overall, HITACHI S-3500N scanning electron microscope is ideal for applications such as biomedical research, semiconductor engineering, microfabrication, and microscopy. Its powerful imaging and analytical capabilities make it the ideal tool for those looking for high-quality, accurate data and results.
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