Used HITACHI S-3500N #9194718 for sale

HITACHI S-3500N Scanning Electron Microscope (SEM) is a powerful and flexible tool for scientific research. This microscopy equipment uses a beam of electrons instead of light to produce an image. It is an industrial grade instrument that can create high-resolution images of microscopic specimens, with magnification up to 5000x. S-3500N is designed to accommodate a wide range of sample sizes, materials, and shapes. The chamber can accommodate samples up to 65 mm in diameter and 45 mm in height. The alignment of the sample is assisted by stage adjustment of up to 4°. The specimen Sample Chamber comes equipped with a variable-pressure SEM (VP-SEM), which allows for low-vacuum operation and improves the resolution of images. The imaging performance of this system is supported by a number of features, such as advanced signal processing technologies and enhanced signal detections. These include a wide range of electron signal types, including a secondary electron imaging mode, backscattered electron imaging and X-ray signal detection. The unit also features a high-precision BSE detector with a detector coating and an ultra-high resolution CCD camera. This machine is also equipped with a dual-axis ESEM, which enables both tilt and rotation capabilities. The tilt and rotation functions enable the collection of multiple images with different perspectives in a single scan at high-resolution. The specimen's topography can be recorded even at low magnifications. In addition, the dual function imaging mode greatly enhances images and enables 3D observations. HITACHI S-3500N is also able to perform a wide range of qualitative and quantitative analyses, including automated image identification and analysis, particle size analysis and elemental identification. The built-in analysis software allows for powerful non-destructive image analysis, such as image segmentation, detection, measurement, and integration of fine scale images. This microscope has also been designed to meet the safety needs of a variety of research and industrial applications. Some notable safety features include high-voltage safety interlocks and limit switches, soft-start electron beam emission, and a variety of memory storage capabilities.