Used HITACHI S-3500N #9242550 for sale

HITACHI S-3500N Scanning Electron Microscope offers high-end imaging performance, enabling researchers and engineers to visualize and analyze very small particles with unprecedented accuracy. Its beam-combining technology provides superior image clarity and resolution, allowing users to get an up-close and detailed look at samples. S-3500N also features a variety of digital imaging capabilities, including automated imaging, smart beam, image stitching, 3D reconstruction, and more. HITACHI S-3500N employs a Schimidt camera to get all its imaging power. This is a special type of imaging method that produces extremely accurate images with higher performance than traditional SEMs. It uses a combination of scanning electron beams to enable both 8 and 12 bit detection, which gives incredibly high resolution down to 5 billion dots per inch (5 nanometers). This means that users can inspect very fine details in the sample. S-3500N uses advanced optics to provide higher contrast and brightness, perfect for studying challenging materials such as semiconductor materials or carbon fiber. With a large field of view of up to 18cm2 and high resolution images, users can easily capture details of complex structures. One of the highlights of this scanning electron microscope is its ability to accurately measure surface topography at the nanometer level. This can be very useful for getting reliable measurement data on very small samples. It features auto level correction and correction algorithms to ensure accurate measurements. HITACHI S-3500N is also equipped with the latest in Smart SEM technology to ensure maximum efficiency and convenience, allowing users to automate workflow processes. This includes an intuitive user interface, automated sample positioning, and automated image stitching. With its advanced SEM programming capability, S-3500N can also be used for advanced functions such as 3D reconstruction and automated processing. Overall, HITACHI S-3500N Scanning Electron Microscope is an incredibly powerful tool for researchers and engineers, giving them the ability to be able to analyze very small particles with unprecedented accuracy. It provides advanced imaging capabilities and allows users to get a detailed look at samples with higher resolution and contrast. It also features a variety of automation functions to make complicated tasks easier.