Used HITACHI S-3500N #9291860 for sale

HITACHI S-3500N is a widely used high resolution scanning electron microscope (SEM) designed for a wide range of applications in academic and industry research. It is equipped with a number of features that make it ideal for examining the microstructure of a variety of materials including metals, polymers, ceramics, and composites. The primary function of S-3500N SEM is to produce images of surfaces with resolutions as high as 2.5nm. The SEM utilizes a tungsten filament to create the electron beam that is focused onto the sample being analyzed. The sample is then scanned across the viewing stage with the backscattered or secondary electrons being collected and detected by an electron detector. The SEM can be used to magnify the image up to 30kx. HITACHI S-3500N is also equipped with an energy dispersive x-ray (EDS) detector that allows for elemental analysis of the sample being analyzed. This EDS detector is able to detect a wide range of elements including light elements such as boron and chlorine as well as heavy elements such as uranium and lead. The elemental analysis information is then used to create elemental maps that allow researchers to gain further insights into the material. S-3500N also features a range of automated features such as automated focus control and stage tilt correction that allows the user to quickly obtain clear images. The SEM also has an auto-stigmator which allows for accurate and precise imaging. The best feature of HITACHI S-3500N SEM is its ability to create extremely high resolution images with low noise. This allows researchers to gain valuable insights into the microstructure of materials being studied. The SEM also has a user-friendly interface that makes it easy to use. In conclusion, S-3500N is a powerful scanning electron microscope that is ideal for analyzing the microstructure of a range of materials. It is equipped with a number of features including an automated focus and stage tilt correction system, an energy dispersive x-ray (EDS) detector for elemental analysis, and an auto-stigmator for accurate and precise imaging. HITACHI S-3500N can create images with resolutions as high as 2.5 nm, making it a perfect tool for researchers looking for detailed results.