Used HITACHI S-3500N #9411750 for sale

HITACHI S-3500N is a scanning electron microscope (SEM) designed to provide scanning and imaging capabilities for analysts, researchers, and scientists in the nanoscale field. It is capable of achieving magnifications up to 800kX and has a maximum theoretical resolution of 1.4 nm in conventional scanning mode. S-3500N is ideal for samples in a wide range of fields, including semiconductor, data storage, and life sciences applications. The SEM operates with a high-resolution, energy-dispersive X-ray detector that has been integrated with a standard equipment. The microscope is capable of producing high-resolution images of samples and can detect particles down to 0.037 nm. It utilizes a backscatter detector to produce high-contrast images and is equipped with an enhanced low-voltage primary gun that is capable of detecting samples with a low charging rate and providing a bright, high-quality image. HITACHI S-3500N also provides an automated alignment system, allowing for easy specimen preparation for scanning. The microscope is capable of automatically adjusting the alignment parameters and compensating for surface distortions that may be present in the sample. This ensures that the image is as accurate and clear as possible. Additionally, the microscope can collect a wide range of information on the sample, including composition, surface topography, and 3-dimensional structure. S-3500N is also equipped with a wide range of operating modes and functions, allowing the user to easily adjust parameters to acquire the best possible image from the sample. It also features a working distance monitor to alert the user of any potential collisions during operation, ensuring safe and precise operations. For ease of use and maintenance, HITACHI S-3500N is also equipped with an automated sample loading unit and a variety of diagnostic monitoring functions. The SEM also includes a micrograph viewing software, allowing the user to quickly analyze and manipulate images directly on the microscope. Additionally, the microscope includes a variety of customizable user profiles, allowing users to configure the microscope to their specific needs. Overall, S-3500N is a reliable and versatile scanning electron microscope (SEM) that provides excellent image quality and state-of-the-art features. It is ideal for researchers and scientists working in a variety of fields and provides an automated sample loading machine, a wide range of operating modes, and an automated alignment tool for precise imaging of nanoscale samples.