Used HITACHI S-3600N #293775574 for sale

HITACHI S-3600N is a scanning electron microscope (SEM) which is designed to provide users with high-quality scanning images. The instrument features a high-performance, dual-stage, low-vacuum SEM with a low accelerating voltage, making it ideal for imaging inorganic and organic specimens. The robust construction of S-3600N ensures that repeatable images can be obtained, and it has a high resolution of 2nm. HITACHI S-3600N is equipped with backscattered electron (BSE) detectors, which enable researchers to perform chemical and microstructural analysis. This instrument also includes an energy dispersive x-ray spectroscopy (EDS) detector, which is useful for compositional analysis. The variable-pressure mode of S-3600N allows the researcher to work with non-conductive specimens without the need for conventional sample preparation. HITACHI S-3600N also has an integrated vacuum system, which enables the researcher to control the vacuum settings of the specimen stage. This ensures that the specimen is subjected to the optimal conditions in order to obtain the best results. Furthermore, S-3600N is equipped with a wide variety of software packages, which enable the user to analyze the acquired images throughout the experimental process. In addition, HITACHI S-3600N has an environmental chamber, which enables the researchers to conduct experiments in a controlled atmosphere. This is especially useful when studying specimens with water content, as the vacuum-level can be maintained while continuing the experiment. Furthermore, the user can adjust the humidity and temperature levels for the optimal performance of S-3600N. Overall, HITACHI S-3600N is a powerful and versatile SEM which can be used for a variety of applications. It has an advanced high-resolution imaging system, an integrated vacuum system, and an environmental chamber for controlled experiments. In addition, S-3600N offers a range of software packages and detectors, which enable the user to perform advanced analyses of their specimens.