Used HITACHI S-3600N #9314101 for sale

HITACHI S-3600N is a scanning electron microscope (SEM) that offers a high performance imaging capability. It is equipped with a Schottky Electron Multiplier (SEM) and a wavelength dispersive X-ray detector to produce high resolution and quantitative analysis of surface features and composition. S-3600N has an impressive working distance of up to 50mm, which provides for great flexibility in specimen viewing and analysis. The high tension voltage range of 0.1 kV to 30 kV offers superior image quality and detection limits to allow for detailed analysis of even nano-scale features. HITACHI S-3600N has a large sample size range that can accommodate samples up to 300mm in diameter. The in-column energy filter is capable of up to 10 μs/channel dwell time so that even extremely small particles can be detected and observed. S-3600N has a full spectrum of imaging modes that allow for imaging of standard and complex surface features. Secondary electron imaging (SEI), back scatter electron imaging (BSEI), backscatter electron diffraction (BED), x-ray emission, e-beam induced current (EBIC) and electron beam spectroscopy (EBS) can all be used for standard, non-destructive characterization. HITACHI S-3600N utilizes a range of detectors that include a secondary electron detector, multiple X-ray detectors, energy filter, and an array detector for EBSD. These detectors provide quantitative analyses of surface features such as crystalline structure and chemical composition. The high-vacuum chamber of S-3600N is low-maintenance and produces images with low noise and electron-beam trajectory stability. Built-in vibration dampening system reduces imaging instabilities and provides high-resolution images without additional alignment. It features a EasyBeam lens alignment that allows users to quickly and accurately align the electron beam to the specimen. HITACHI S-3600N offers convenient operation via the large 10.4" bright LCD monitor, one-touch joystick control, and Ez-Navigation hot keys. It is powered by high-speed Intel Xeon processor and state-of-the-art electronics that provide robust, reliable operation. S-3600N offers an impressive combination of advanced features and imaging capability, making it an ideal choice for electron imaging and surface analysis in materials science research. This system provides a powerful yet economical solution for high resolution imaging applications.