Used HITACHI S-3700N #293778349 for sale

HITACHI S-3700N scanning electron microscope (SEM) is a high precision, high performance instrument designed for biological, medical, physical and material science research. Featuring advanced imaging and analytical capabilities, HITACHI S 3700 N allows users to visualize material structures and surfaces in detail. S-3700N is equipped with a field emission gun (FEG) electron source, enabling extremely high resolution imaging and a wide range of magnification levels. It utilizes secondary and backscattered electrons to capture images and produce detailed 3-D surface morphology, compositional information and elemental distributions. Additional image and analytical modes include In-lens Detector (ILD), Low Vacuum, Scanning Transmission, Elementary (EDX) and Electron Backscatter Diffraction (EBSD). S 3700 N features automated staging and navigation functions, multi-channel automatic selection capability and advanced imaging and mapping software tools for easy operation and reliable, reproducible results. Its superior depth of field and three-dimensional reconstruction capabilities make this instrument especially suitable for sample tomography. Additionally, HITACHI S-3700N offers a wide variety of detector options, including a large chamber vacuum detector, variable pressure (VP) detector, spectrometer detector, electron energy loss spectroscopy (EELS) detector, energy-filtering transmission (EFT) detector and energy-resolved detector. Moreover, it offers optimum sample handling with its standard sample transfer and outgassing capabilities. Overall, HITACHI S 3700 N is an extremely advanced scanning electron microscope suited for a wide range of research and analytical applications. Its simple operation, low maintenance requirements and solid imaging capabilities are of great benefit for any laboratory. S-3700N is an extremely versatile and precise instrument for imaging and analysis of a variety of complex samples.