Used HITACHI S-3700N #293794261 for sale

HITACHI S-3700N is a high-end scanning electron microscope (SEM) renowned for its excellent performance, high magnification, and superior imaging quality. This instrument is capable of delivering exceptional images of the finest details, even in difficult sample environments. Equipped withelectron beam detectors, electron-optical lenses, an image analysis computer, and a large, high-resolution camera, HITACHI S 3700 N enables accurate analysis of samples under a variety of conditions. The high-powered electron beam emitted by the high voltage source of S-3700N is modulated by an electron deflector system. This allows for the generation of images of microstructures down to the nanometer level via the modulation of electrons. The system is also designed with energy filters that limit sample damage and provide greater contrast in the images. S 3700 N's electron-optical lenses are able to focus the beam on the sample surface, providing a highly magnified image. This is further enhanced by the use of an in-lens detector, which allows for a range of magnifications from up to 50,000 times. Additionally, the in-lens detectors can detect fine details down to a few nanometers. HITACHI S-3700N is also equipped with secondary electron (Slive) detectors, and a backscatter (Bsive) image detector. These detectors allow for the display of images and features, such as microstructural variations, grain boundaries, and cracks. Furthermore, the Bsive detector allows for a wider range of magnifications, without the need for additional lenses. An image analysis computer is connected to HITACHI S 3700 N to enable the analysis of high-resolution images in real-time. This can be used to measure various features such as surface area, volume, porosity, and number of particles. The image analysis computer is capable of plotting detailed graphical data as well as producing quantitative reports for further analysis. Finally, S-3700N is equipped with a large, high-resolution camera. This allows the user to take detailed photographs and videos of samples, enabling them to interpret the results quickly and accurately. In conclusion, S 3700 N scanning electron microscope is a powerful instrument, providing exceptional performance, imaging quality, and high magnification. With its various detectors and image analysis computer, HITACHI S-3700N is capable of analyzing samples as small as a few nanometers. This makes it an ideal tool for a variety of research and industrial applications.