Used HITACHI S-3700N #9350985 for sale

HITACHI S-3700N is a high-resolution scanning electron microscope (SEM) capable of producing visual images of ultra-fine detail with a resolution of 0.5 nanometers. It uses a powerful electron gun to emit a focused beam of electrons that scan over a sample surface, creating a high-resolution electro-optical image. HITACHI S 3700 N comes with a multicollector computer control equipment and a variety of software packages to ensure accurate, clear images. This SEM uses a 0.3mm focusing aperture combined with a variable pressure (VP) stage for variable pressure sample manipulation. The variable pressure stage allows the user to adjust the sample's exposure to the electron beam in order to observe different depths and levels of detail. S-3700N is also capable of secondary electron imaging (SEI) and in-lens detection (ILD). SEI produces higher-resolution surface detail images by detecting electrons that are reflected from features on the sample surface. ILD produces images of surface features as small as 10 nm. S 3700 N is equipped with an automated scan control system that allows users to select their preferred scanning mode, magnification, and exposure time. This unit can produce either static (fixed) or dynamic (adjustable) image resolutions depending on the user's needs. The SEM also includes an automated focusing machine and can store up to 15 magnification settings. HITACHI S-3700N requires a high vacuum environment and temperature-controlled environment to effectively produce images. Its maximum acceleration voltage is 30kV and it is capable of producing images of samples between 1mm and 3mm in size. In addition, the microscope can handle both organic and inorganic samples of varied materials, including metals and alloys. HITACHI S 3700 N has the option of a variety of image analysis software packages that can be used to measure angles, areas, and distances. Features such as automated counting, automated pattern recognition, and automated 3D reconstruction further enhance the microscope's potential for detailed analysis. These features can provide information about the surface composition, structure, and electron diffusion. Overall, S-3700N is an exceptionally-equipped SEM with a powerful electron beam, multicollection computer control tool and a variety of image analysis software. It can produce high resolution images of samples between 1mm and 3mm in size, and it has the capability to analyze angle, areas, and distances, as well as automated 3D reconstruction. This SEM is ideal for researchers and professionals looking for a powerful and reliable scanning electron microscope.