Used HITACHI S-4000 #9151182 for sale
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ID: 9151182
Scanning electron microscope (SEM)
Film photography
Performance: 1.5 nm resolution
Magnification: 20 to 300,000x
Electron gun: Cold-cathode field emission electron gun
Emission extracting voltage: 0 to 6.5 kV
Accelerating voltage: 0.5 to 10 kV in 100 V steps, 10 to 30 kV in 1 kV steps
Lens system: (2) Stages electromagnetic lens
Objective aperture: Movable aperture ((4) Opening selectable / Alignable outside column)
Stigmator coil: Electromagnetic type
Scanning coil: 2-Stage electromagnetic type
Motion range:
X: 0 to 25 mm Continuous
Y: 0 to 25 mm Continuous
Z (WD): 5 to 30 mm Continuous
Tilt: -5° to 45°
Rotation: 360° Continuous
Maximum specimen size:
76 mm (load lock) in diameter (Airlock specimen exchange)
Cold FEG electron source
102 mm in diameter (Draw-out specimen exchange)
Pumps:
Ion pumps for the gun and DP
Mechanical pump for vacuum.
HITACHI S-4000 is a high-performance scanning electron microscope (SEM) manufactured by HITACHI High-Technologies Corporation. HITACHI S4000 is designed for use in research and analytical laboratories for various applications, including materials and surface analysis, metals and non-metals, contaminants, polymers, and biological samples. S 4000 is equipped with a CODED SE (cathode-type) beam gun and a secondary electron detector equipment, with a digital camera, an energy dispersive X-ray detector, and a detachable slit collimator. The scanning electron microscope also includes an automatic sample changer, an integrated sample stage, a motorized remote control, external beams for detectors and accessories, and a sample navigation system. S4000 features a variable-pressure chamber with resonance technology, capable of operating under both low- and high-vacuum pressures to scan samples. The chamber also prevents contamination of the sample by removing particles during operation. The electron gun has a cathode-type filament and a cold field emission for optimal performance and stability. It is further equipped with an adjustable gun-end emission current for a wide range of applications. The gun is capable of producing an adequately bright image with low noise. S-4000 is equipped with an integrated high-definition digital camera providing high resolution imaging. This digital camera is complemented with a magnetic focusing lens and a correction grid, allowing improved resolution for finer feature imaging. The energy dispersive X-ray detector utilizes a semiconductor detector for X-ray analysis, and its preamplifier allows enhanced X-ray resolution and detection. The microscope also includes a high-sensitivity beam condenser, which enhances beam intensity and reduces image noise. In addition, HITACHI S 4000 includes a multi-focus detector, allowing simultaneous secondary electron imaging and X-ray analysis. The unit is further equipped with a secondary electron detector machine which utilizes auto-focus for imaging fine 3D structures. Further, the slit collimator, combined with the height-measuring tool, allows stereoscopic imaging of samples. HITACHI S-4000 is a powerful scanning electron microscope, providing a wide range of capabilities and features for a variety of applications. Its advanced control asset allows for easy operations and its durable design ensures reliability and long-term performance.
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