Used HITACHI S-4000 #9217524 for sale

HITACHI S-4000 is a scanning electron microscope (SEM) designed as a sophisticated research tool for a wide range of applications. It provides unprecedented levels of operation, performance, accuracy and reliability. At the heart of HITACHI S4000 is its electron column, which is based on an environmental chamber design that ensures a clean and accurately controlled environment inside the column. This design ensures that high resolution imaging and analysis can be performed. The column also features a highly efficient electron gun with a maintenance-free design. It is also capable of providing a variety of electron beam para The column is controlled by a high-speed digital motion controller, which provides high-precision stability and accuracy in positioning of the specimen. The controller also features real-time image stitching capabilities, which ensure accurate spatial mapping of the specimen during imaging and analysis. S 4000 also features an advanced imaging system to facilitate accurate imaging and analysis. It contains a wide range of detectors, such as backscattered and secondary electrons and a range of UV-visible light detection systems. The imaging systems have been designed to provide consistent image quality over a broad range of parameters. S-4000 also has a number of features to ensure accurate sample preparation. For instance, it has a dedicated specimen bed that can be adjusted for different specimen sizes, as well as a built-in gas injection system for sample preparation. There are also a number of automated control parameters, which can be adjusted according to user requirements. Overall, S4000 provides researchers and technicians with a powerful research tool that can deliver high resolution imaging and analysis. Its sophisticated electron column, imaging system and sample preparation features all combine to provide reliable and accurate results. HITACHI S 4000 is the perfect choice for researchers and technicians who need accurate and reliable results from an SEM.