Used HITACHI S-4000 #9361956 for sale

HITACHI S-4000 is a field-emission scanning electron microscope (FE-SEM) capable of producing high resolution, high magnification images. Developed by HITACHI High-Tech Analytical Science Corporation, HITACHI S4000 supports a wide range of analysis modes, including SEM, EDS (energy dispersive X-ray spectrometer), and micro-processing. S 4000 is a dual-beam equipment, meaning it is equipped with both a scanning electron gun and a focused ion beam gun. This allows for a variety of sample preparation and imaging techniques. The FE-SEM utilizes a tungsten filament to generate the electron beam, providing excellent transparency images with a maximum resolution of up to 1nm. The focused ion beam gun emits a very focused beam of ions for sample preparation and processing. This beam can be used for thinning samples, preparing cross-sections, and other modifications. S4000 is equipped with a high-sensitivity EDS system, allowing elemental analysis of samples at ultra-high resolution. The EDS unit is designed with powerful technology that allows for high-speed and high-accuracy analysis of small samples. Compatible with a variety of sample holders, HITACHI S 4000 can analyze large and small samples. S-4000 also includes state-of-the-art software that allows for fully automated and intuitive operation. This software provides powerful features such as extended depth of field imaging, increased signal-to-noise ratio, automated digital Z-contrast imaging, as well as automated scratch diagnostics, and 3D micrograph reconstruction. This machine is an all-in-one solution for various sample imaging and analysis applications. With its wide range of operating modes and high-resolution imaging capabilities, HITACHI S-4000 enables researchers to carry out stereoscopic and 3D imaging, as well as nano-scale imaging and analysis. This scanning electron microscope offers a powerful platform for a variety of applications, from industrial and material science to biomedical research.