Used HITACHI S-4100 #130965 for sale

HITACHI S-4100 is a scanning electron microscope that allows for magnification up to 500,000x. It is capable of both high-resolution imaging and energy-dispersive X-ray spectroscopy for elemental analysis. The microscope consists of an electron gun that directs electrons at a sample substrate where they interact and cause either secondary or backscattered electrons to be emitted. The signals generated from the electrons are then amplified and analyzed by the system to produce images of the sample. S-4100 has a unique variable pressure chamber. This chamber helps allow for high-resolution imaging in air by surrounding the sample by a vacuum which helps reduce electrical charging and instability. The pressure is adjustable with increments ranging from 0.1 Pa to 130 Pa. The stage movement is also automated to allow for quick imaging of large areas without the need to manually move the sample substrate. HITACHI S-4100 also features a multi-channel detector which further enhances the images by allowing for high-contrast results. It is made of a series of solid-state detectors arranged along the circumference of the electrostatic column. The detectors are constructed with material that is resistant to Kr Ar gas which allows for a long working life. The system is equipped with a range of digital acquisition tools for analysis and documentation. These include control options for digital image enhancement, image stacking and stitching, live image operations, digital measurement tools and file storage capabilities. S-4100 also includes several technological advancements. It features complex 3D imaging technology which allows for the scrutiny of multiple layers of information. The auto stigmatizing system ensures pinpoint accuracy of specimen alignment and the Multi-Mode Convergent Detector allows for both bright and dark field images. HITACHI S-4100 also comes with a Patent Pending Grated Aberration Corrector (GAC) which ensures the highest resolution images even at high magnifications. S-4100 is a highly advanced and versatile scanning electron microscope which is suitable for various materials science applications. It offers unmatched imagery clarity and resolution and has multiple analytical functions including imaging and energy-dispersive X-ray spectroscopy, making it an excellent choice for laboratories dealing with imaging and elemental analysis of samples.