Used HITACHI S-4100 #293620142 for sale
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ID: 293620142
Vintage: 1991
Field Emission Scanning Electron Microscope (FE-SEM)
GATAN DigiScan Converter with Mac G4 Computer
(2) Detectors:
SE
BSE
EDX Detector
Cryo transfer unit
Instruction manuals
Spare parts
1991 vintage.
HITACHI S-4100 is a model of scanning electron microscope (SEM) that is used for high resolution scanning and image analysis. The unit provides a high resolution and magnification up to 10000x. It has an advanced high acceleration voltage detector that allows for greater image resolution and contrast at a much higher level than standard SEMs. The unit is equipped with a digital signal processor for more accurate imaging and analysis. S-4100 has an enlarged observation chamber that allows for larger objects to be examined and a higher specification in terms of the availability of high-end detectors. The unit has a wide range of detectors including secondary electrons, back scattered electrons, and X-ray image amplifiers which enable the observation and imaging of different elements. This makes the unit suitable for a wide range of scanning and image analysis requirements. HITACHI S-4100 also has a stage with split-side tilt range and precise autopositioning capability, as well as Z-axis preselection capabilities. The integrated stage enables automatic alignment during imaging and scanning and helps with minimizing manual operations and reducing the time taken for sample preparation. It also has a large field of view for detailed observation of nano-structures, such as micro-channels. The unit has a system of automatic hardware settings that ensures the most suitable parameters for the analysis and SEM imaging can be recalled. The user-friendly control panel helps with quick settings and a system of convenient analysis tools helps with speedy measurements and image analysis. It also has a persistent image archiving system that stores sample information, analysis parameters, images, and measurement data for future reference. The unit is equipped with advanced imaging software for high-resolution SEM imaging and analysis, is capable of generating 2, 4, 9, and 16-colour false color images and is equipped with a 3D mapping tool to generate 3D images. The axis manipulation functions enables easy manipulation, zooming, and rotation of 3D images. Finally, the softcopy color printing is capable of producing color prints at 1920 x 1280 dpi resolution. In conclusion, S-4100 is an advanced scanning electron microscope that provides a high resolution, magnification and a wide range of detectors to facilitate image analysis. Its enlarged observation chamber, automatic alignment capabilities, and various user-friendly features provide ease of use and facilitate quick analysis of the sample in the shortest possible time.
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