Used HITACHI S-4100 #293632896 for sale

HITACHI S-4100 is a high performance scanning electron microscope (SEM) designed to provide users with resolution, contrast, and surface sensitivity that is unsurpassed in the industry. S-4100 incorporates HITACHI unique electronics circuitry, automation technology, and aerodynamic design to offer high speed scanning and imaging in both low vacuum and high vacuum modes. HITACHI S-4100 also features a flexible digital control and data collection equipment that makes it an ideal instrument for various research applications. S-4100 features a unique secondary electron detector that offers exceptional resolution and contrast at low accelerating voltages. This makes HITACHI S-4100 ideally suited for non-destructive imaging of delicate, fragile samples. S-4100 also contains an optional in-lens detector which offers ultra high resolution imaging capabilities that are coupled with excellent surface sensitivity. This makes HITACHI S-4100 an ideal instrument for analyzing surface topography, and for identifying and characterizing microstructures with nanometer-scale resolution. S-4100's mechanical design provides users with simple and reliable operation. HITACHI S-4100's low center of gravity design provides a large stage travel range, with a wide range of sample sizes and shapes that can be accommodated in its tall column. To ensure accurate and repeatable imaging, S-4100 comes equipped with an automated focusing system and automatic gain control. Additionally, HITACHI S-4100 incorporates an advanced dual beam control unit that allows users to easily and quickly switch between low and high vacuum imaging modes for various applications. In an effort to provide users with an easy-to-use, affordable instrument, S-4100 incorporates a CCD camera that is capable of capturing digital images of samples with excellent resolution. This machine offers users intuitive software that is simple to operate and allows them to adjust image contrast, resolution, and brightness. HITACHI S-4100's high performance optical microscopy tool is also ideal for quick and accurate sizing and estimation of feature sizes. In summary, S-4100 provides users with a high performance SEM that offers excellent resolution and contrast, as well as ultra-high resolution imaging. Its unique secondary electron detector and automated focusing asset provide users with reliable and repeatable imaging results. Lastly, HITACHI S-4100 features a simple and intuitive digital control and data collection model, and includes an in-lens detector for improved imaging capabilities.