Used HITACHI S-4100 #9215897 for sale

HITACHI S-4100 is a scanning electron microscope (SEM) built to provide a variety of capabilities within a wide range of applications. It features a specially designed optical column, as well as state-of-the-art digital imaging and image processing. It is well suited for a variety of tasks, including surface topography, crystal structure, size and shape determination, defect analysis and failure analysis. The state-of-the-art optical column of S-4100 consists of a Field Emission Gun (FEG) and a high resolution SEM condenser lenses for selecting the electron beam sample interaction volume. The FEG allows for an optimized electron beam at any accelerating voltage up to 30 kV and an excellence in resolving small features and detail. An improved alignment system further enhances the performance of the SEM condenser lenses by providing an optimal alignment without any adjusting elements. HITACHI S-4100 is equipped with a broad range of imaging options. These include differential image contrast (DIC), combined opto-electron microscopy (OEM), secondary electron (SE) imaging, backscattered electron (BSE), and energy-dispersive X-ray spectroscopic analysis. Specialized imaging techniques such as Crystalline Beam analysis (CBA), Backscattered Diagnostic Mode (BDM), and SynchroScan Secondary Electron Detection System (SSEDS) are also provided. Advanced image processing capabilities are also provided with S-4100. These allow for detail measurements, crystallographic inspections and the creation of 3D reconstruction images which can be used to support characterization of components. A 3D model facility built-in to the image processor allows for the visualization of complex materials and entities. The high-speed deflector sweeping ability of HITACHI S-4100 provides a scanning rate of up to 600 mm/s, resulting in faster and sharper imaging than conventional scanning methods. Also, customizable environmental chambers can be used to ensure the reliable and reproducible analysis of samples in even the most challenging of environments. S-4100 has been designed to meet the demands of modern engineering and research. It features a unique combination of advanced imaging and ultra-fast scanning capabilities, powerful image processing capabilities and an advanced optics component, making it the perfect choice for a myriad of applications.