Used HITACHI S-4160 #180092 for sale

HITACHI S-4160 Scanning Electron Microscope (SEM) is an advanced imaging and analysis tool designed to provide detailed microscopic images of a wide range of sample types. The device utilizes a focused ion beam to scan a sample's surface and produce a magnified digital image depicting what can be up to a million times more than an everyday photograph. With a 5-105kV electron column, HITACHI S 4160 has a unique capability that allows it to perform various types of imaging and analysis such as energy dispersive X-ray (EDX), reflectometry, and signal processing. It can also make quantitative measurements of minute features such as grain boundaries, grain size distributions, and analyze elemental composition, chemical composition, and topography. S-4160 has a maximum working distance of 15 mm and an electron beam energy resolution of 0.2 to 2keV. An image can range from 85 nm to 30 µm in size with the device producing a resolution of 12,000 pixels per mm. It also has a fast response time, with up to 8 frames/sec in stig and up to 200 frames/sec in SE mode.The device also benefits from low drift in both the stigmator and focus controls, with stigmator on/off times under 0.25s. The device has numerous user options for optimizing both the imaging and analysis processes, with multi-segmented current and voltage shifts providing distinct advantages over conventional SEMs. S 4160 also incorporates a versatile feature set for elemental analysis, with the device being able to accurately image the different elements present in samples. With an energy dispersive X-ray detector, HITACHI S-4160 produces detection at up to 15,000 counts/sec, which is helpful for determining the distribution and concentration of different elements on a sample. For compositional analysis, the device provides accurate measurements thanks to its automated silicon drift detector and X-ray source liftoff controls. In conclusion, HITACHI S 4160 Scanning Electron Microscope is an advanced imaging and analysis system made possible through the use of state-of-the-art technology. Its superior sensitivity and resolution provide unparalleled imaging, while its advanced analysis capabilities, including both elemental and compositional analysis, make it the ideal solution for research and scientific applications.