Used HITACHI S-4160 #293625350 for sale
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ID: 293625350
Wafer Size: 6"
Field Emission Scanning Electron Microscope (FE-SEM), 6".
HITACHI S-4160 is an advanced scanning electron microscope (SEM) that combines a high-resolution and high throughput for imaging samples. It is equipped with a field emission electron gun that provides excellent low level signals and long-term stability, with a high throughput of 20,000 images/second, making it suitable for imaging both large area and detailed shots. The strong electron beam allows for a finite spot size and high probing speed for improved resolution and expedited imaging. HITACHI S 4160 uses a state-of-the art Magnification Control equipment that allows for a wide range of magnification levels and a unique indexed objective lens that provides optimal resolution of the sample being observed. This system also features an improved energy-filtering unit that allows for image measurements of thicker samples while enhancing the clarity of the image. S-4160 is equipped with a CoolView device that monitors the environment of the machine and adjusts the operation accordingly while also displaying the current observation conditions. The CoolView also helps to enhance resonance resolution to reduce environmental risks associated with imaging in harsh and extreme temperatures. S 4160 also comes with an optional Secondary Electron Imaging machine, which can be used for imaging of surface characteristics in order to measure wettability, contrast, glazing, or discoloration of the sample. This tool can also be used for visualizing surface characteristics and determining with accuracy the surface of engineering materials. HITACHI S-4160 is a comprehensive imaging asset that is an excellent tool for evaluating the features and properties of materials and components. It offers a high-precision scan control process of up to 35,000 images/second to support a wide range of material analysis. Moreover, images captured by HITACHI S 4160 have ultra-high resolution that allow for precise and accurate analysis. This high-performance SEM model is ideally suited for high-resolution imaging and sophisticated analysis needs of a wide variety of materials and components. Its advanced technology, sophisticated controls and intuitive software makes it an excellent tool for researching and analyzing a wide range of materials, from industrial to nano-scale components.
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