Used HITACHI S-4160 #9313656 for sale

HITACHI S-4160 is a scanning electron microscope (SEM) that provides robust, reliable and high performance imaging. This equipment utilizes an ultra-high vacuum chamber and a high-vacuum inlet that allows for rapid sample transfer and efficient operation. It is equipped with high-precision lenses and a digital imaging system that allows for sharp, detailed imaging of specimens at magnifications of up to 400,000x. HITACHI S 4160 employs a field emission gun (FEG) electron source, which produces a high-intense, low-angle electron beam that helps achieve superior imaging capability. The FEG electron source also generates ultra-low distributions of electrons and less charging of samples due to its low beam current. The microscope's wide range of accessories gives it the capability to imaging specimens in a variety of configurations including backscattered electron, secondary electron, cathodoluminance, and x-ray mapping modes. S-4160 has superior analytical capabilities that include energy-dispersive x-ray analysis (EDS), electron backscatter diffraction (EBSD), wavelength-dispersive x-ray analysis (WDS) and electron imaging. The microscope's Energy Filtering (EF) detector allows for high-sensitivity detection of light elements with an optimal detection limit of 50 ppm or less. The microscope also uses a high-resolution EBSD option that offers superior resolution and low contrast imaging. S 4160's computer control unit enables the user to control and image multiple samples simultaneously. This machine provides a real-time viewing software that automatically adjusts the view to the changing specimen structure and simultaneously monitors a range of parameters such as probe current, focus, and astigmatism. HITACHI S-4160 comes with a range of accessories, such as stage risers, granulators, and sample holders. These accessories allow the user to precisely control the position and view of the sample. HITACHI S 4160 also includes an automated sample preparation process that features a sputter-coater, carbon depositor, and a cryogenic device to help partially or fully prepare samples before they are imaged. This SEM tool is designed to be highly reliable and offers long-term operations for a wide range of applications.