Used HITACHI S-4200 #9107348 for sale

HITACHI S-4200 is a versatile scanning electron microscope (SEM) designed for high resolution imaging of a wide range of samples in scientific and industrial research. This model is capable of high resolution imaging of samples from basic topographic viewing to high resolution imaging and low kV imaging of micron sized particles. HITACHI S 4200 comes equipped with a high performance digital imaging equipment, providing users with superior image clarity, contrast, and resolution using a wide range of imaging modes. It has a simple operating system making it easy to use for new and experienced users alike. Users can choose from nine different mapping modes including element mapping, dual circularly polarized light (DCP) mapping, and Raman mapping. Multiple-stage automated navigation tools are also included for efficient imaging of large or irregularly shaped samples. It has an adjustable accelerating voltage from 5 to 30 kV, allowing for low and high kV imaging modes. Low kV imaging is necessary for identifying micron-level features. S-4200 also has an adjustable source current to adjust the brightness of the image which is needed for achieving high resolution imaging. S 4200 also has an optional energy dispersive spectrometer option for identifying elements based on their atomic number. This allows for phase or elemental mapping of samples. It is also equipped with a coating unit for producing a fine protective layer on the sample surface. This coating is necessary for the observation of non-conductive samples. HITACHI S-4200 has an inert gas circulation unit and an exhaust circulation machine, preventing noise levels from exceeding the required limits. This tool also helps preventing sample damage from electrons. The vacuum pumps have a noise level of only 28 dB (A). HITACHI S 4200 is an ideal tool for any professional looking for high resolution imaging, elemental mapping, and low kV imaging. It is designed with the user in mind, providing a simple and efficient asset that allows for high quality imaging and analysis of a wide range of samples.