Used HITACHI S-4200 #9216770 for sale

HITACHI S-4200 is a scanning electron microscope (SEM) with an ultra-long working distance designed for observation and analysis of large samples. It has a Field Emission Gun (FEG) and high-speed secondary electron imaging capability that enable precise imaging at low voltages (as low as 0.1 kV). HITACHI S 4200 features a large chamber depth (400mm) which allows for observation of large samples and a long working distance of 380 mm, providing access for the analysis of samples which have limited space. S-4200 also features the maximum acceleration voltage of 15kV, zero-degree condenser lens with a current of 1 μA, and a fast scan-splitting system. This ensures the high resolution and efficiency that is required for precise imaging and analysis. The built-in analytical systems, including Energy Dispersive X-ray analysis (EDS) and Electron Backscatter Diffraction (EBSD), enable the determination of crystal structure and composition of materials. In addition, the customizable settings of the cooling device enable stable, long-term imaging of biological samples. S 4200 is an ideal device for imaging large-scale samples such as integrated circuits (ICs), diesel and fuel injection systems, and wire harnesses. This device has the ability to obtain higher-magnification images with a throughput that is up to 3 times faster than that of conventional SEMs. Additionally, HITACHI S-4200 performs electron tomography, which is useful for obtaining the three-dimensional (3D) structure of a sample that is impossible or difficult to obtain using other imaging methods. HITACHI S 4200 has a vacuum chamber with an automatic holder for large samples and is equipped with automated sample handling systems, such as auto loader and auto unloader. This allows the easy transfer of samples from the chamber and improves the efficiency of the analysis. S-4200 has a size well-suited for use in industrial or research laboratories. This precision SEM offers some of the best resolution imaging available, and is suitable for applications such as biological cell imaging, IC defect analysis, nanoscale structure observation and many other research fields.