Used HITACHI S-4200 #9288014 for sale

HITACHI S-4200 is an advanced scanning electron microscope (SEM) designed for the analysis of a wide variety of materials, particularly those with small structures and densely packed features. This SEM comes equipped with a high-resolution, magnified imaging equipment that can magnify objects up to 400,000x, with an imaging resolution of 1.2 nanometres. HITACHI S 4200 combines a powerful electron optics and detection system, and a wide variety of compatible sample stages. The wide range of sample stages available for S-4200 allows for analysis of a wide variety of sample types—including semiconductor samples, nanoscale objects, biological cells, and material fractions. For imaging samples, S 4200 features a secondary electron detector, backscattered electron detector, and an optional x-ray energy dispersive detector unit. The secondary electron detector of HITACHI S-4200 allows for the simultaneous acquisition of magnified secondary electron images, with resolution up to 1.2 nanometers. The secondary electron detector can also be used to perform automated SEM imaging with the automatic focus feature. The backscattered electron detector of HITACHI S 4200 allows for surface composition analyses at low magnifications, with a resolution of 10 nanometers. S-4200 features a unique auto-sampling function that moves the sample automatically between the multiple sample holders for maximum comfort and convenience. The auto-sampling feature increases the efficiency of laboratory testing, while also saving time and reducing human error. S 4200 also offers an optional nano-probe spectroscopy module that enables the user to map the electron energy-loss spectroscopy (EELS) of a sample in high precision. HITACHI S-4200 also allows for Focused Ion Beam (FIB) milling, a technique that provides an ideal mean of collecting samples that is efficient and minimally invasive to the sample. HITACHI S 4200 is also equipped with several software systems from HITACHI such as 3DViewer, 3DReconstruction, and Material Analysis Machine (MAS). These software packages offer a wide variety of features for the analysis of samples, including 3D imaging capabilities, contrast enhancements, automated image stitching, and many other features. Overall, S-4200 is an incredibly powerful and versatile SEM, that can be used for a diverse range of scientific research and industrial applications. Its capabilities offer unprecedented insight into the microscopic world and allow scientists and engineers to explore and understand the physical universe in unprecedented detail.