Used HITACHI S-4200 #9288534 for sale

HITACHI S-4200 Scanning Electron Microscope (SEM) is a high-precision instrument that enables users to observe intricate structures of solid objects, including image analysis of a wide range of materials, from organic molecules to inorganic crystals. This microscope utilizes a scanning electron beam which is suddenly deflected by an electric field or magnetic field. This produces a beam of electron energy that can be detected by a photosensitive detector situated on the back of the microscope. The data generated is then analyzed and displayed as a highly detailed, three-dimensional image. HITACHI S 4200 model is an especially high-resolution model and utilizes an electron probe diameters of up tp 2nm. It has a maximum acceleration voltage of 20 kV. This accelerates the electron beam to such a high velocity that even the smallest structures of a sample can be detected. Additionally, this increases the image contrast and depth of focus. The main components of the microscope are the electron column, objective lens, optical lens system, and movement stage. The electron column consists of the electron gun, diaphragm, and collector lenses. The objective lens is the primary source of electrostatic and magnetic lenses that focuse the electron beam to the sample. The optical lens system helps in imaging the sample by optically magnifying the SEM images. The movement stage facilitates the movement of the sample for precise scanning. S-4200 SEM is equipped with a number of features that improve operation of the microscope. These include the auto-adjust feature, which ensures optimal resolution for various samples. It also includes an EDS system, which allows for chemical analysis of the sample using backscattered electron images and energy-dispersive spectroscopy. Additionally, the moving stage compensates for the investigation field displacement caused by the magnetic and electrostatic fields within the sample. This provides unparalleled precision for accurate analysis of the sample. In short, S 4200 Scanning Electron Microscope is an incredibly versatile and precise tool for studying both organic and inorganic samples. Its advanced features enable researchers to observe the finest features of a sample in stunning three-dimensional detail.