Used HITACHI S-4200 #9313769 for sale

ID: 9313769
Field Emission Scanning Electron Microscope (FE-SEM) Manual.
HITACHI S-4200 scanning electron microscope is a powerful instrument for taking precise measurements of a variety of specimens. HITACHI S 4200 boasts a range of features that enable researchers to work with a wide array of sample materials and gain detailed insights into their microstructures. S-4200 scanning electron microscope offers an observation range of 5nm to 500mm, making it ideal for investigating nanoscale features and larger-scale objects. S 4200 also offers a unique imaging system, which enables users to capture incredibly detailed images and 3D observations. With a maximum resolution of 60nm and a maximum magnification of 250,000X, images captured using HITACHI S-4200 are of an incredibly high resolution. HITACHI S 4200 is equipped with twin, liquid-nitrogen-cooled electron guns that provide a wide range of electron accelerated potentials, from 0.8kV to 40kV. This powerful acceleration enables a wide range of applications such as elemental mapping, x-ray analysis, and image enhancement. S-4200 also offers a suite of accessories that can be used to control and optimize the performance of the microscope. For example, the Dauerlevitor probe is designed to provide stable, repeatable measurements of surface features, allowing for extremely small features to be measured precisely. The SILeWave monochromator enables researchers to achieve a greater level of contrast when they need to identify fine details within the specimen. S 4200 can also be connected to optical devices such as the TESCAN X-ray Microscope and Digital Imaging Systems. This enables the user to combine optical and electron imaging for improved contrast and resolution. By using a range of adjustable parameters, HITACHI S-4200 can be optimized to suit the objectives of the user. It can be used to obtain detailed images of microscopic objects with a high level of accuracy, enabling researchers to further their understanding of them.
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