Used HITACHI S-4300 #293795543 for sale

HITACHI S-4300
ID: 293795543
Field Emission Scanning Electron Microscope (FE-SEM).
HITACHI S-4300 is a high-performance scanning electron microscope (SEM) designed for imaging, elemental analysis and inspection in the fields of materials science, nanotechnology and semiconductor fabrication. This advanced SEM has a wide range of capabilities, including high-resolution imaging, element analysis, topographical analysis and nano-scale measurement. TheS-4300 provides high-magnification imaging with a 20 mm field of view, and a resolution of up to 2nm. It also features a highly sensitive energy-dispersive X-ray microanalysis (EDX) equipment, which measures the elemental composition of observed sample detail down to a resolution of 0.1 nm. It is capable of detecting concentrations as low as 0.01 atomic percent. Using this analysis feature in combination with the SEM, HITACHI S 4300 can perform elemental mapping of test samples as well as detailed topographic analysis. TheS-4300 has an advanced control system for precise positioning of the sample on the stage. It is equipped with a hexapod sample manipulation unit for fast and accurate motion control. In addition, S-4300 can sample up to 400mm by 400mm, making it suitable for a range of sample sizes and applications. In terms of operation and maintenance, S 4300 features an advanced touch panel controller that simplifies the operation of the machine. It includes an intuitive user interface and comprehensive image processing tools. This tool also includes an integrated cooling asset for optimal performance. HITACHI S-4300 scanning electron microscope is the ultimate tool for conducting highly detailed imaging, elemental analysis and nano-scale measurements. It is a powerful and versatile microscope that provides superior performance and ease of use, making it ideal for a wide range of research and application areas.
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