Used HITACHI S-4300 #293815108 for sale

HITACHI S-4300 scanning electron microscope is a high performance scanning electron microscope designed for a wide range of research applications. This microscope utilizes advanced technology to provide users with powerful imaging solutions. HITACHI S 4300 utilizes a field emission gun (FEG) electron source to generate a high-resolution, high-brightness electron beam that can be directed to a wide variety of sample sizes and shapes. This microscope features an adjustable aperture that can be set to allow the most suitable resolution and contrast of the image. The specimen can be viewed in SEM mode or in electron backscatter diffraction (EBSD) mode at resolutions up to 0.4nm. In addition, this microscope can be used with multiple detectors for both imaging and analysis, including energy dispersive spectroscopy (EDS) for elemental analysis, spectrometers for angle-resolved photoemission spectroscopy (ARPES), spectrometers for x-ray fluorescence (XRF) for depth profile information, and scanning micropore imaging (SMI) for 3D mapping of nanoscale structures. S-4300 provides precise control of the acceleration voltage and easily adjustable scan rates to ensure high contrast and image resolution. Further, this microscope includes a navigation/joystick controller for smooth movement and easy exam setup, and an automated stage which gives precise up-down and x-y positioning for accurate, repeatable results. Furthermore, S 4300 is designed to meet the demands of ongoing research needs, with simple servicing and maintenance procedures and system upgrades. This microscope is ideal for researchers who need state-of-the-art imaging technology for non-destructive samples evaluation.