Used HITACHI S-4300 #9112452 for sale

HITACHI S-4300 is a scanning electron microscope (SEM) designed for the characterization of surfaces. It is a field emission scanning electron microscope (FE-SEM), employing a field emission source for generating a high quality electron beam. It is an easy-to-use system capable of providing highly detailed imaging and analysis of a wide range of samples. HITACHI S 4300 boasts an ultra-high level of resolution of <0.8nm, allowing users to observe very small features and characterize the structure of a sample in incredible detail. It is equipped with an energy dispersive X-ray spectrometer (EDS) that can be used to perform elemental characterization with a high degree of accuracy. Together, these capabilities make it ideal for applications such as electron microscopy of biological systems, nanotechnology materials, failure analysis and educational purposes. S-4300 can handle large samples, and its accessibility allows observation and analysis over a range of magnifications up to 100,000x. It has a wide range of stage tilt capabilities with angle adjustments from 0 to 90 degrees. This makes it well suited for performing toroidal studies and viewing inclined surfaces. It is also equipped with several advanced imaging techniques such as backscattered electron imaging and secondary electron imaging. Backscattered electrons reveal surface features while secondary electrons show fine details of materials. S 4300 also offers an automated version of secondary electron imaging called "gallery imaging," which helps to rapidly scan large areas of a sample at a low sample-to-detector distance. These features enable HITACHI S-4300 to efficiently collect data quickly with resolution as fine as <10nm. In addition, HITACHI S 4300 is fitted with a powerful XYZ Piezo motor enabling automatic movements on the x, y and z-axis planes. This allows users to automate scanning patterns such as raster scanning and line scanning. This automated movements provide faster, higher resolution images with less charging artifacts. In summary, S-4300 is an advanced instrument capable of providing high quality imaging and analysis of a wide range of samples. With its advanced imaging and analysis capabilities, ultra-high resolution and a wide range of stage tilt capabilities, this scanning electron microscope is an invaluable tool for a variety of applications.