Used HITACHI S-4300 #9164240 for sale
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ID: 9164240
Vintage: 1999
Scanning Electron Microscope (SEM)
Manual stage system
Operating system: Window NT
Secondary electron image resolution:
1.5 nm or better at 15 kV
5.0 nm or better at 1 kV
Operating system: Windows NT
Magnification: 20x, ~5,000,000x
Accelerating voltage: 0.5, ~30 kV (Variable at 0.1 kV/step)
Image shift: ±3 μm (W.D=30 mm)
Image navigation: Standard for motor drive stage
Specimen thickness: 17 mm
Specimen size through airlock: 100 mm diameter
Specimen stage:
Stage / Standard stage / Large stage
X / 0~25 mm / 0~100 mm
Y / 0~25 mm / 0~50 mm
Z / 5~30 mm / 5~35 mm
R / 360° / 360°
T / -5~+45° / -5~+60°
Electron optics:
Electron source: Cold field emission electron source
Objective aperture: Heated type
Detectors:
Secondary electron detector
YAG BSE Detector (option)
Take-off angle for EDX spectrometer: 30°
CRT Display language: English
PC, OS: PC/AT Compatible, windows
Operation: Mouse, keyboard and function rotary knobs
Viewing monitor: 17" LCD
Automated functions:
Auto-focus
Auto-stigmation
Auto-brightness and contrast
Auto-start
Auto-photo modes
Image processing:
Image manager software
Raster rotation
Frame memory:
640 x 480 pixels
1,280 x 960 pixels
2,560 x 1,920 pixels
Image filing: Built in image data base with search functions
Image format: BMP, TIFF, JPEG
Auto data display:
Accelerating voltage
Magnification micron marker
Micron value
Film number
W.D
Date / Hour
Photo magnification
Detector
Vacuum system: Full automated system with pneumatic valves
Attainable vacuum:
~10-7 Pa (Electron gun)
~10-4 Pa (Sample chamber)
Vacuum pumps:
IP: 60 l/s x 1, 20 l/s´2
DP: 570 l/s 1
RP: 140 (168) l/min x 2 for 60 Hz
Protection system: Power, water and vacuum failures
Includes:
Windows base control system: Diffusion pump
Chiller
(2) Rotary pumps
Missing part: SDD Detector
1999 vintage.
HITACHI S-4300 represents a high resolution monochromatic scanning electron microscope. This device features easy operation, increased productivity, and low environmental impact. It is a great scanner for a variety of analytical and research applications. This model has adjustable accelerating voltage with a maximum of 40kV, and a resolution of 1.8nm, making it optimal for for both high-resolution imaging and elemental analysis. This microscope also uses a monochromator to select the desired wavelength of electrons for minimizing background noise and for improved contrast in imaging. The electron optical components of this scanning electron microscope are designed to ensure optimal, efficient performance while eliminating unnecessary noise. The sample chamber is nitrogen purged with a pumping system to maintain high vacuum levels. These factors significantly reduce the chances of sample contamination and degradation while providing high-resolution scanning capabilities. Additionally, HITACHI S 4300 features a High Sensitivity Conversion Electron Detector (HS-CED) which provides exceptional signal-to-noise performance for improved image resolution and contrast. Additionally, the device has an Electro Spray Ionization Module (ESI) that can be used for secondary ion mass spectrometry (SIMS). This data is extremely valuable for more detailed analysis of the sample material. Finally, S-4300 offers a tilting stage which can be used for large-area imaging or for in situ imaging. This function allows the operator to view a larger area than it would with standard static imaging; this is useful for finding smaller particles or studying the structure of a sample from multiple angles. Overall, S 4300 offers superb performance when it comes to scanning electron microscopy. Its adjustable voltage, high resolution imaging capabilities, and signal-to-noise performance, ensure accurate and powerful results for a variety of research and analytical applications. The tilting sample holder further enhances the capacity of the instrument for large-area imaging. This device is ideal for material science imaging, quality control and nanotechnology research.
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