Used HITACHI S-4300SE Type II #9228128 for sale

HITACHI S-4300SE Type II Scanning Electron Microscope (SEM) is a heavy-duty, state-of-the-art instrument suitable for a wide variety of materials analysis applications. S-4300SE Type II offers exceptional image quality and high resolution imaging capabilities, making it an ideal choice for laboratories and research organisations that need a reliable and versatile imaging tool. The equipment consists of an electronic column, an electron beam gun, a signal processing system, and a digital multi-mode interface. The column is the unit in which the electron gun, source condenser lens, and objective lens are housed. The source condenser lens is responsible for focusing the emitted electrons while the objective lens which is positioned close to the sample serves as the image magnifying lens. The signal-processing unit is a crucial element of the SEM as it is responsible for interpreting the signal data received from the sample and producing a digital image of the sample for viewing. The machine is able to achieve a maximum resolution of 8 µm, enabling users to render sharp images of 'invisible' details in samples. The electron beam gun, located in HITACHI S-4300SE Type II column cap, determines the size of the electron beam which varies depending on the size of the device's objective aperture. The gun has an adjustable high-tension control which can control the voltage of the beam, allowing for more accurate measurements. The digital multi-mode interface provides users with easy access to the SEM, allowing them to quickly set up and control experiments, as well as to view and export images. This feature allows users to access remote instruments and control them at a distance, in addition to providing access to options and software tools that can further enhance the imaging capabilities of the tool. In addition, S-4300SE Type II has an extended vacuum capability which allows users to work with air and non-conductive samples in certain modes, as well as a charging corrector which allows for accurate imaging of thicker samples. HITACHI S-4300SE Type II Scanning Electron Microscope is an ideal choice for high-resolution imaging and materials analysis applications. Its reliable and versatile asset provides users with unrivalled image quality and maximum resolution, while its extended vacuum functionality and digital multi-mode interface further expand its capabilities.