Used HITACHI S-4300SE #293636336 for sale

HITACHI S-4300SE is an advanced analytical scanning electron microscope (SEM) designed to deliver easy and reliable imaging and analysis capabilities. The SEM is based on two technological advancements - high-performance analytical imaging and low-vacuum environmental scanning. This setup provides high-precision imaging of features smaller than 0.1 μm and the resolution of up to 3 nm, equivalent to 0.05 nm in a backscattered electron detector. The high-speed, digital signal processing (DSP) and image intensifier technology provide stable imaging and analysis regardless of the specimen material or surface finish. This ensures time saving and efficient operation. It also facilitates a wide range of applications from general SEM to electron backscattered diffraction (EBSD). The SEM settings such as detector settings and electron source settings are customizable for various sample sizes and characteristics. HITACHI S-4300 SE utilizes a high-performance electron source, the Schottky type field emission electron source, which is characterized by its uniformity, convergence angle and beam stability. With an accelerating voltage of 5-30 kV and wattage of 200 W, it provides enough sample coverage and penetration to facilitate high-resolution imaging of small, delicate structures. Furthermore, it comes with a range of advanced detectors - an Everhart-thornley (ET) secondary electron detector, a Cressburn-type backscattered electron detector, an Ultrafast Imaging Detector (UFD), and a Reflection High Energy Electron Diffraction (RHEED). The main benefits of S-4300SE are its versatility, convenience, and its ability to deliver precise imaging and analysis. Its advanced optics and external control interface provide better imaging and fine-tuning of parameters. Additionally, users can access up to 3 modes of operation - standard, advanced, and low vacuum. This ensures that users can adjust the electron source and detector according to the specific properties of their sample. Furthermore, the integrated EcoMode reduces energy consumption and avoids cross contamination between samples. In conclusion, S-4300 SE is a powerful, versatile, and easy-to-use scanning electron microscope capable of delivering high-resolution imaging with a range of advanced detectors and customizable parameters. Its sophisticated design and easy-to-use interface enable users to quickly and accurately analyze a wide variety of samples, thereby facilitating accurate and reliable research and analysis.