Used HITACHI S-4300SE #9226015 for sale

ID: 9226015
Field Emission Scanning Electron Microscope (FESEM).
HITACHI S-4300SE scanning electron microscope is a powerful instrument used in a wide array of scientific and industrial applications. It is equipped with a range of features which make it ideal for precise imaging, research and analysis. HITACHI S-4300 SE is a field emission SEM that operates in variable pressure mode. This enables exceptionally high resolution imaging, as well as low-vacuum imaging at a reduced acceleration voltage. It offers a range of voltage settings, which can be adjusted depending on the application. This enables the instrument to be used as a both an imaging and analytical tool. S-4300SE is equipped with an advanced digital signal processor which can capture images and videos in real-time. This makes the instrument particularly suitable for dynamic processes, such as thermal imaging. The high-sensitivity detector not only offers excellent resolution, but it is also capable of achieving high-resolution images of even the finest sample structures. S-4300 SE offers a variety of functions, including post-processing image optimization algorithms and integrated image analysis capabilities. It is also equipped with a variety of accessories, such as a polarized light analyzer, integrated E-beam interaction chamber and an ultra-high vacuum mode. This makes the instrument suitable for a wide range of applications, including materials science, mineralogy, life sciences and defect inspection. HITACHI S-4300SE also boasts a variety of safety features, including an enclosed chamber, ESD protection and safety-monitored critical system components. This ensures that the instrument is safe to use in a variety of environments. Overall, HITACHI S-4300 SE scanning electron microscope is a powerful and versatile instrument. It offers excellent resolution, real-time imaging capabilities and a range of integrated functions. It is well-suited for a wide range of applications, including research and industrial analysis.
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