Used HITACHI S-4500 Type I #293603166 for sale
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ID: 293603166
Vintage: 1997
Field Emission Scanning Electron Microscope (FE-SEM)
Display unit
SEI Electronic collection
5-Axis of movement
Manual type
Controller
Transformer
Chiller
Air compressor
Optional items: EDS detector and ion sputter coater
Resolution: 1.5 nm
Field emission electron gun
High vacuum system
Ion pump
Diffusion pump
Rotary pump
Magnification configuration: 20x - 500,000x
No ball field
Acceleration voltage: 0.5-30 kV
Operating system: Windows 7
Power supply: 220 V, 20 A, 4 kW, Single-phase
1997 vintage.
HITACHI S-4500 Type I is a high performance scanning electron microscope (SEM) developed by HITACHI High-Technologies. This remarkable microscopy tool combines advanced technology, superior design, and affordability to provide a cost-effective SEM solution for a broad range of research and industrial applications. The S-4500 equipment has been designed for enhanced functionality and usability, and its capabilities include high resolution imaging up to 8nm, three-dimensional surface profile measurement, full frame EDS analysis in 10 frames per second, and automated particle size analysis. It is equipped with a high-performance low-vibration baseframe, superior stage motion mechanism, and high transmission, low contrast secondary electron detector for high quality imaging of biological specimens. The S-4500 features an automated sample centering mechanism, allowing automated sample insertion into the sample chamber, enabling users to easily and quickly set up experiments. Additionally, the system includes a 4-axes stage, which allows users to freely position the specimen in any direction, enabling full 3-dimensional analysis. The unit also includes a low-noise, automatically-calibrated high-resolution image detector, which provides clear and contrasty imaging ideal for identifying and analyzing submicron features. Additionally, the software package includes a powerful 3D imaging feature allowing users to visualize surface topography and shape. The S-4500 delivers truly impressive imaging capabilities with minimal mechanical noise, making it an ideal choice for ultra-low noise specimen imaging. The integrated sample handling machine is designed for ease of use, and provides quick and efficient loading, gripping and positioning of the sample. The S-4500 is a versatile and affordable narrow-angle scanning electron microscope, ideal for high precision imaging and analysis of a broad range of specimen types. It is designed for easy operation, offering intuitive software, excellent image quality, and an array of fully automated sample processing. As a result, the S-4500 is an ideal tool for a variety of applications ranging from industrial quality control to advanced scientific research.
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