Used HITACHI S-4500 Type I #9234337 for sale
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ID: 9234337
Wafer Size: 2"
Vintage: 1995
Scanning Electron Microscope (SEM), 2"
Resolution:
1.5 nm (15 kV WD-4 mm)
4.5 nm (1 kV WD-3 mm)
Magnification:
F: x50 ~ x500,000
F: x20 ~ x1,500
Electron optical system:
Cold cathode field emission electron gun
Extractor voltage: 0 ~ 6.5 kV
Accelerator voltage: 0.5 ~ 30 kV
Lens system: 3-Stage electromagnetic lens reduction system
Object lens aperture: 4-Position externally selectable
Scanning coil: 2-Stage electromagnetic
X: 0~25 mm
Y: 0~25 mm
Z: 3~28 mm
Range:-5° ~ + 45°
Rotation: 360°
Maximum diameter: 50 mm
Scanning mode:
Normal reduced area
Line scan
Photo scan
Spot position
Split screen
Scanning speed:
TV, 0.3. 2, 10 (9), 20 (26) Sec / Frame
40 (35), 80 (100), 160, 320 Sec / Frame
Signal processing:
Real-time processing
Auto-brightness
Contrast control
Dynamic stigmator
Vacuum system:
Full automatic operation
With pneumatic valve control
Ultimate vacuum:
Electron gun chamber: 10^-7 Pa
Specimen chamber: 10^-4 Pa
(3) Ion pumps
Diffusion pump
(2) Mechanical pumps
Air compressor
Protective device:
Blackout
Water outage
Low vacuum
1995 vintage.
HITACHI S-4500 Type I is a high-performance scanning electron microscope (SEM) for general purpose research. It has been designed for imaging, elemental and chemical analysis, and elemental mapping of a variety of sample types. S-4500 Type I has an accelerating voltage of 0.1 to 30 kV, a minimum spot size of 1 nm, and a maximum magnifying power of 950,000x. Additionally, the microscope is equipped with two environmental chambers, a new field emission electron gun, and a low-noise detector. HITACHI S-4500 Type I is capable of both standard scanning electron microscopy and analytical energy dispersive X-ray (EDX) spectroscopy. This advanced imaging technology allows users to visualize, measure, and analyze the structure and composition of samples at the nano-scale. EDX has a detection limit of 12 ppm and a resolution of 1.2 eV, which allow for highly precise elemental analysis. The EDX system is also equipped with an automatic programming function to facilitate analysis of multiple samples. S-4500 Type I is an advanced scanning electron microscope optimized for high-precision imaging, analysis, and elemental mapping in physical, chemical, and biological applications. Its field emission electron gun and environmental chambers allow for imaging with high resolution and low noise. Additionally, its EDX system has a detection limit of 12 ppm and a resolution of 1.2 eV, allowing for highly precise elemental and chemical analysis. In summary, HITACHI S-4500 Type I is an ideal choice for researchers who require high-performance imaging and analysis capabilities.
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