Used HITACHI S-4500 Type II #293592472 for sale

HITACHI S-4500 Type II is a high-performance desktop scanning electron microscope (SEM) designed to meet the demands of a wide range of research and industrial applications. With focus on imaging and analysis, HITACHI S-4500 TYPE-II provides excellent imaging capabilities with a large sample chamber and a high resolution image of up to 2µm. S-4500 Type II utilizes several imaging techniques, such as secondary electron imaging (SEI), backscattered electron imaging (BSE), energy dispersive X-ray spectroscopy (EDS) and wavelength dispersive X-ray spectroscopy (WDS). S-4500 TYPE-II is equipped with a unique thermal field emission gun (TFEG) electron source for ultra-high resolution SEM imaging. The advanced design of the TFEG electron source, with its higher electron doses, higher beam energies and superior performance, provides users with the capability of measuring very small features of samples (down to <2 nm) with higher contrast and sharper images. HITACHI S-4500 Type II comes with a large sample chamber and a wide range of accessories for precise sample handling. The sample chamber is equipped with hierarchical X-Y scanning stages for precise sample positioning and calibration, full auto-correlative stages for precise sample positioning, full auto-correlation stages with traveling range of stages of up to 100 mm, and a sample heat-sink to eliminate thermal drift in the sample chamber. To improve sample visualization and analysis, several automated analysis functions are available which include measurement functions and the ability to add annotations and drawings to the images. HITACHI S-4500 TYPE-II supports a wide range of real-time automated analysis, including particle analysis, elemental mapping and detection, and advanced line profiling. S-4500 Type II has a closed-loop active temperature control system for improved temperature stability at the sample chamber, which helps improve the overall imaging performance and repeatability of results. Its wide range of imaging, analytical, and automation capabilities make it an ideal tool for detailed microstructural analysis of a wide range of samples.