Used HITACHI S-4500 Type II #9230775 for sale

HITACHI S-4500 Type II is a scanning electron microscope (SEM) with both imaging and analytical applications. The high resolution SEM utilizes an electron gun to generate an electron beam which is then focused onto the sample surface, enabling observations of surface features, elemental distributions and compositional mapping. The contrast between a sample feature and its environment can also be observed in detail. HITACHI S-4500 TYPE-II features a field emission gun (FEG) electron source that generates an electron beam with an energy range of 10 kV to 30 kV. This energy is then used to scan a sample surface, with a resolution of 0.17nm and a detection of 0.1nm on non-conductive samples, with sub-nanometer resolution possible on conductive samples. Different electron detectors in the SEM measure the sample's secondary electrons, back scattered electrons and reflected electrons, providing rich information about the sample, such as topography, composition and bond types. For analytical purposes, S-4500 Type II is equipped with two energy dispersive X-ray spectrometers (EDS) and two Wavelength-Dispersive X-ray spectrometers (WDS). Utilizing these spectrometers, elemental composition and crystal phases of a sample can be detected and analyzed in detail. The SEM is also able to detect, measure and map sample properties such as electrical conductivity, contact potential difference and surface charge. The analysis of the sample is displayed with a 2-D display feel and numeric values for identified elements. In addition, S-4500 TYPE-II utilizes its environmental system to ensure a secure sample observation. For protection against external influences, the SEM is equipped with a vacuum chamber, a cryo-pump unit, an optional gas inlet system, a sample heater and magnification adjustments to ensure safe and stable sample analysis. By leveraging its scanning electron beam and the multiple attached spectrometers, HITACHI S-4500 Type II Scanning Electron Microscope enables efficient imaging and analysis of sample surfaces, providing valuable data on topography, elemental composition and phase even at sub-nanometer resolution. The environmental control system further aids in the safe and precise analysis of a sample, ensuring accurate and reliable data.