Used HITACHI S-4500 #130136 for sale
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ID: 130136
Wafer Size: 2"
Vintage: 1994
FE SEM, 2”
Performance:
Secondary electron image resolution: 1.5 nm at 15kv
Magnification: 20X - 500KX
Electron Optics:
Electron gun: Cold field emmission source
Lens type: electromagnetic
Objective aperture: 4 position externally selectable
Stigmator: Octopole electromagnetic
Scanning coil: 2-stage electromagnetic
Sample Chamber
Airlock: prepumped, max sample size:100 mm or 150 mm diameter
Stage motion: 5 axis manual
X/Y: 100mm/50 mm, Z: 3-33 mm, T: -5 Deg - +60 Deg., R: 360 deg continuous
Display system:
Image display: Dual 12" monitors
Scanning mode: Normal, reduced area , line scan, photo scan, spot position, split screen
Scanning speed: TV, 0.3, 2, 9, 25, 35, 100, 160 320 s/frame
Signal processing:Real-time processing, auto-brightness and contrast control, dynamic stigmator, autofocus, a Frame averaging, frame integration, contrast conversion,
Vacuum system:
Full automatic operation with pneumatic valve control
Ultimate vacuum: 10 (-7) Pa in electron gun chamber, 10(-4) Pa in specimen chamber
Ion pump: 60 L/s X1, 20 L/s X2
Specimen chamber: DP (570 L/s); Turbo Optional
Foreline: Rotary pump X2
Accessories (Optional)
EDX:at 30 Deg. take off angle
Digital Image capturing: Orion-6 software, Optional
Chilled water circulator: 10 - 20 deg C, 1.0 -1.5 L/m for DP only
Installation
AC: Single phase AC 220 or 240 volt, 50/60 Hz
Grounding: Independent grounding 100 Ohms or less
1994 vintage.
HITACHI S-4500 is a scanning electron microscope commonly used in scientific research laboratories. This advanced instrument provides extremely high resolution imaging due to its concurrent operation of field and backscatter detectors. It also offers automated operation, with a user-friendly interface and excellent automatic functions. HITACHI S 4500 uses an electron optics column that produces electrons through the filament electron gun and controls the electrons with a deflector electron column. The gun produces beam electrons which travel through the column and are focused by a condenser lens, which then strikes the sample to create secondary electrons. The secondary electrons are detected with the detectors, while both the primary electrons and electrons scattered off the sample are collected by the detectors as backscatter electrons. S-4500 comes with a variety of software packages such as image setting, image editing and reconstruction, image data processing, electron backscatter diffraction (EBSD), energy dispersive spectroscopy (EDS), EDS/EBSD integration, and particle size analysis. These programs use the detector information to produce various images of the sample, as well as edges, grain size and other data measurements from the visualized sample. S 4500 is incredibly versatile and can easily be manipulated for a variety of purposes. It has a maximum magnification of 500,000 times distant magnification, a field of view of 118nm, and is capable of detecting the surface roughness and the thickness of specimen. The angle of operation can also be adjusted to any angle between 0 to 45°, while a total of 60 increments can be chosen for specimen rotation, providing a highly accurate imaging option. Thanks to its high-resolution imaging capabilities, excellent automation, and exceptional versatility, HITACHI S-4500 is a powerful tool in research laboratories and other environments. With its user-friendly interface and excellent automatic functions, users can quickly make good use of this cutting-edge instrument. Overall, HITACHI S 4500 is an important component of any laboratory and can provide greater insight into intricate samples, enabling highly accurate analysis.
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