Used HITACHI S-4500 #293594619 for sale

HITACHI S-4500 is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging. It is a next-generation, high-performance FE-SEM based on a polarized-field design and featuring a new, high-speed scanning equipment. HITACHI S 4500 provides exceptionally high resolution, image stability and image contrast, enabling it to capture information from a wide range of samples and materials. S-4500 features a large chamber, high stability and low vibration. The chamber allows for a wide range of imaging techniques and environmental conditions. An on-board environmental control system (ECS) enables manual or automated control of temperature, gas and pressure, making it easy to set up and control multiple experiments. A built-in motor generator provides up to 160mm of movements and the sample stage is both low-noise and high-precision. S 4500 is designed to accommodate a wide range of applications, including high resolution imaging, sample focus optimization, 3D sampling, related software packages, and evolutionary integration. It has an integrated HD camera (compatible with most HITACHI S-4500 cameras) and direct connection to the HD monitor, allowing images to be transmitted while the sample is being scanned. The camera also enables the analysis of larger samples over a wide range of magnifications. When it comes to the performance of HITACHI S 4500, its field-emission gun (FEG) is in a league of its own. The FEG design is unique in its capability to produce both high-resolution images and high-magnification images at the same time. It produces an impressive resolution down to 1nm, enabling sub micron imaging, and a maximum magnification of 500,000x. S-4500 is also capable of taking spectroscopic measurements via an energy dispersive X-ray detector (EDXD) and a cathodoluminescence unit (CLS). The EDXD ensures an accurate analysis of a sample's elemental composition, and the CLS is ideal for studying luminescent materials. To ensure reliable and accurate instrument operation, S 4500 also has a range of software and automatic functions, including ultrasonic cleaner, reproducible sample cleaning, a vacuum interlock machine and an automatic microscope alignment tool. This automated alignment asset allows the user to set up and maintain accurate magnification calibration, enabling the creation of true transverse images. Combining outstanding performance with reliability and ease of use, HITACHI S-4500 scanning electron microscope is the ideal choice for high-resolution imaging, sample focus optimization, and evolutionary integration. With its unique FEG design, its Spectroscopic measurements, high-magnification imaging, advanced software, and automatic functions, HITACHI S 4500 provides optimal results across the full range of sample applications.