Used HITACHI S-4500 #293597006 for sale

HITACHI S-4500 is a type of scanning electron microscope (SEM) that is produced by HITACHI High-Technologies Corporation. This particular model is a high-performance, digital imaging device that is used in a variety of microscopy techniques. It is equipped with a dedicated detector to make high-resolution imaging a reality. The system contains a direct electron detector or flip chip sensor, giving users the ability to capture detail on a nano scale. HITACHI S 4500 has a high resolution for imaging and a wide field of view. It is capable of imaging items at a resolution as high as 10nm, which is a fraction of a micrometer in size. The scanning electron beam is generated by a FEG (field emission gun) which helps with its imaging capabilities. This microscope also offers a low vacuum mode which enables samples to be viewed with relatively minimal damage. The system also offers three different modes to allow the user to adjust the imaging capabilities to fit their individual requirements. The Scanning Transmission Mode is best for imaging organic samples, the Backscatter Mode is for imaging softer materials, and the Secondary Electron Mode is great for imaging a variety of samples. This SEM also has a fully automated stage which allows faster sample set-up, saving time and energy for the user. Furthermore, it has advanced data acquisition capabilities that allow users to store and analyze their images at a later time. S-4500 also offers a wide variety of features that help with its operation. These include an auto-stigmasation that allows users to quickly adjust the alignment of the imaging beam, an advanced sample navigation tool, and a range of automated correction tools to help compensate for any errors that may be seen in the images. S 4500 is a popular scanning electron microscope among scientists, technicians, and engineers in multiple industries. It is a powerful and versatile tool that is capable of producing high resolution images and offers a wide array of features to aid in the processes of imaging and analysis.