Used HITACHI S-4500 #293634652 for sale

HITACHI S-4500 scanning electron microscope (SEM) is a high-performance and reliable imaging and analytical instrument. It is equipped with a large chamber and a high resolution Vacuum SE (Variable Pressure SE) detector, allowing the user to acquire detailed and high-resolution images of samples. HITACHI S 4500 is capable of producing highly detailed and accurate 3D images, as well as displaying a wide variety of compositions and physical properties of samples, thanks to its large chamber, large field of view, high resolution Vacuum SE detector and several advanced imaging technologies. S-4500 is based on the technology of electron field emission and adopts two main types of detection systems for different imaging tasks. Both system employ Elstar detectors that can provide a resolution of up to 5nm. There is also a monochromator for the systems for selective imaging. S 4500 has an extensive collection of imaging modes, including: secondary electron imaging (SEI); backscattered electron imaging (BSE); cathodoluminescence; microprobe; and a wide variety of analytical techniques, such as energy dispersive spectroscopy (EDS). HITACHI S-4500 is provided with a standard operating software, and HITACHI offers additional software packages to optimize the instrument's performance. First, the "e-Imaging" package provides a user-friendly graphical user-interface (GUI) with 3D mapping capabilities and the automated image processing "Image Scan" program. Both of these packages allow the user to tailor the operation to their individual needs, ensuring that the images are generated with maximum efficiency and accuracy. Additionally, the sample temperature can be controlled by the optional cooling system, further allowing for more detailed examination of samples for a wide range of materials. HITACHI S 4500 can be integrated into a laboratory system through several peripheral devices, such as a secondary electron (SE) and backscattered electron (BSE) detector, stage automation controller and software, as well as a sample chamber heater. The heater is used to raise the temperature of the sample chamber to reduce thermal expansion of parts during electron beam exposure. Additionally, S-4500 can be integrated with a microscope stand for ease of operation and secure sample positioning. Overall, S 4500 SEM is one of the most reliable, accurate and versatile scanning electron microscopes available. With its combination of advanced imaging and analytical techniques, high resolution detectors and optional peripheral devices, users can produce science-grade results with maximum efficiency.