Used HITACHI S-4500 #293646027 for sale

HITACHI S-4500 Scanning Electron Microscope (SEM) is a leading-edge, digital imaging equipment designed to provide advanced imaging capabilities for use in research and industrial settings. The system is equipped with a specially designed double-tilt stage and a wide range of accessories that allow for a wide range of imaging needs. HITACHI S 4500 is a scanning electron microscope using a dynamic secondary electron detector to capture images. It operates at a resolution of 0.25nm or better, producing highly detailed images with excellent contrast. The optics used includes a novel back-scattered electron detector, which allows for the imaging of smaller particles with a high level of detail. The various operational modes of S-4500 include high-voltage imaging, low-voltage imaging, and conventional imaging. In high-voltage imaging, the sample is scanned with an electron beam of high voltage, enabling a higher magnification and greater resolution than other SEMs. Low voltage imaging requires less voltage and, while the resolution is slightly lower, it produces images with more accurate coloration. The conventional imaging mode records images at lower resolution but with improved signal to noise ratio. In addition to its imaging features, S 4500 is also equipped with a range of other features. These include software for automation of certain SEM imaging functions, a scan management unit that assures reliable imaging, and a comprehensive collection of accessories that can be coupled with the machine for a range of applications. Features such as the back-scattered electron detector and low-voltage imaging ensure that HITACHI S-4500 can image a wide range of materials and surface structures with high accuracy and detail. HITACHI S 4500 is a powerful SEM that provides advanced imaging capabilities for a range of research and industrial settings. With its various imaging modes, advanced optics, and wide range of accessories, S-4500 is an ideal tool for obtaining detailed images of microscopic structures with exceptional accuracy and clarity.