Used HITACHI S-4500 #293657539 for sale

HITACHI S-4500 Scanning Electron Microscope (SEM) is an advanced instrument designed for research and development applications. It allows for extremely detailed analysis of very small objects, including imaging and analysis at atomic levels. The SEM operates by firing electrons at a sample and creating an image of the sample through its detection of electrons that are scattered back from the sample. This technique allows for imaging of very small objects with high resolution and excellent depth of focus. HITACHI S 4500 utilizes both secondary electrons and backscattered electrons for imaging and analysis. Secondary electrons allow for imaging of surfaces and surface features, and backscattered electrons provide information about the composition and structure of the sample. S-4500 also allows for energy dispersive spectroscopy (EDS) and x-ray analysis (XA). EDS is used to identify and quantify elemental composition of the sample, while XA permits analysis of small features that are below the resolution limits of SEM imaging. In addition, the instrument is equipped with a 3D surface profiler which allows for measurement of roughness and molding of the surface of a sample. To provide maximum imaging resolution, S 4500 contains a dual-stage vacuum system that maintains a high-vacuum state both in the main chamber and surrounding column. The main chamber is equipped with an automation system to enable independent control of electron source and detector systems. A computer is used to control HITACHI S-4500's hardware, give instructions to the automation system, and process the images that are gathered. HITACHI S 4500 works with two different types of operating systems, enabling compatibility with most existing processing software. Overall, S-4500 scanning electron microscope is a powerful and reliable instrument which offers high resolution and excellent depth of focus. It is capable of imaging and analysis of extremely small objects at the atomic level, as well as offering energy dispersive spectroscopy and x-ray analysis for a variety of research and development applications.