Used HITACHI S-4500 #293658619 for sale

HITACHI S-4500
ID: 293658619
Scanning Electron Microscope (SEM).
HITACHI S-4500 is an automated scanning electron microscope (SEM) designed for high throughput and precise imaging with a powerful imaging system. It is used for industrial and research operations, especially in the fields of nanotechnology, materials science, and biomedical science. HITACHI S 4500 is equipped with a field emission gun (FEG) in the source chamber that offers an increased performance in terms of resolution, current stability, and electron optical brightness. The FEG also eliminates artifacts due to chromatic and geometric aberration of conventional tungsten filaments, which makes it ideal for high-resolution imaging and particle analysis. A high tension voltage of up to 40kV is employed to focus the electrons in the primary column, providing well-focused, high-resolution images. S-4500 is designed with a fully automated X-Y stage with coarse to fine movement capabilities, enabling high-throughput specimen observations and analysis. It is capable of achieving a maximum scan rate of up to 150 mm/s. Also included is a dual-point Schottky field emission detector, allowing for simultaneous observation of both secondary and backscattered electrons. The Dual-Point detector increases the accuracy of particle analysis and enables automated onboard pattern recognition methods The software of S 4500 offers a range of image processing and analysis capabilities, which allows users to create detailed 2D and 3D images and collect data sets for further research. The software is also equipped with automated measurement capabilities, providing accurate spatial quantification of objects observed in the sample. HITACHI S-4500 is an excellent tool for the analysis of suspicious or difficult-to-analyze substances, due to its powerful electron optical system and automated image-processing capabilities. It is the ideal instrument for laboratories that are looking for an automated low-maintenance SEM that offers high performance imaging and quantification.
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