Used HITACHI S-4500 #293678433 for sale
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HITACHI S-4500 scanning electron microscope is an advanced system designed to allow users to observe microscopic images with high resolution and great detail. HITACHI S 4500 utilizes an advanced detector and vacuum chamber to deliver highly magnified images of specimens on a screen. The vacuum chamber of S-4500 is maintained at a low pressure, usually around 10-2pa to 10-7pa, by the vacuum pump connected to the equipment. It prevents atmosphere particles from interfering with the imaging process while keeping samples well sealed. The primary imaging technology employed in S 4500 is called secondary electron imaging. When a scanning electron beam is focused on a sample, electrons from the sample interact with particles from the electron beam to generate secondary electrons. The secondary electrons are analyzed and directed onto an electronic platform which interprets the images in high resolution and detail. HITACHI S-4500 also includes an array of detectors for additional imaging modalities such as backscatter, DoS, and vacuum ultraviolet optical signals. The backscatter detector increases the numerical aperture of the microscope for improved image detailing, and the DoS detector can be used to measure elemental composition of the sample. The controls of HITACHI S 4500 are user-friendly and customizable. The X, Y and Z stages can move in increments of 0.1μm with a maximum stroke of approximately 50mm. Image feedback systems help with fine strokes and navigation in three dimensions. The stage also supports within sample roaming with a maximum speed of 10 mm/s. The software of S-4500 includes automated functions for step-and-shoot imaging and image stitching to extend the FOV, 3D-reconstruction for tomographic imaging, and automated object recognition functions for automated sample selection, acquisition, and quantification. S 4500 offers remarkable imaging capability because of its wide range of imaging options and user-friendly controls. Its advanced technology, multiple detectors, and advanced software let researchers explore their samples to the micro- and nanoscale with unprecedented accuracy and detail.
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